Hesham El-Sherif
Assistant Professor
hesham.elsherif@ejust.edu.eg
Personal Info
B17-F2-11
Industrial and Manufacturing Engineering (IME)
Prof. Hesham El-Sherif is a materials scientist and electron microscopy expert with over a decade of experience in advanced characterization techniques for nanomaterials and semiconductor devices. He earned his Ph.D. in Materials Science from McMaster University in Canada in 2021, where his research focused on multiscale electron microscopy of atomically thin layers at heteroepitaxial interfaces. Prof. El-Sherif held a postdoctoral fellowship at Harvard University’s Rowland Institute in the USA and completed a visiting fellowship at MIT.nano center where he specialized in atomic-resolution imaging and spectroscopy of layered materials.
Prof. El-Sherif has contributed to over 17 journal publications, including publications in Nature Physics and Nature Communications, Advanced Materials, Advacned Funtional Materials, ACS Nano, Nano Letters and ACS Applied Materials & Interfaces with a focus on 2D materials, graphene heterostructures, and thin films. Prof. El-sherif is also a reviewer at Nanoscale Horizons, Materials Horizons, and PCCP journals. He has also held technical roles in industry, including as an Engineer at imec in Belgium and Microscopy Specialist at TechInsights Inc. in Canada, applying microscopy to semiconductor reverse engineering and failure analysis.
Beyond research and industry, Prof. El-Sherif has taught mechanical engineering and materials characterization courses to over 3,500 students across multiple egyptian universities including Cairo University and Zewail City for Science and Technology. He mentored multiple undergraduate and graduate researchers. He actively bridges academic and industrial research through collaborative projects in materials characterization and semiconductor technologies.
Electron Microscopy, Materials Characterizations, Semiconductor Devices, 2D Materials, Thin film technologies.
